EDAX Launches New XLNCE Series of XRF Analyzers for Coating Thickness and Composition Analysis

Press Release from EDAX Inc.

Release Date:  Monday, March 09, 2015

MAHWAH, NJ – EDAX Inc., a leader in X-ray microanalysis and electron diffraction instrumentation, has launched the XLNCE SMX-BEN, the first in a series of new XRF analyzers for rapid, non-destructive coating thickness and composition analysis. 

The SMX-BEN benchtop analyzer, which is being shown for the first time at Pittcon 2015, is a metrology tool for process development and quality control. It is capable of quickly and easily analyzing both multi-layered and single-layered substrates containing up to 30 elements, with layers ranging from less than a nanometer to microns in thickness. 

“The SMX-BEN delivers performance and versatility in a compact form factor, at an unbeatable price-to-performance ratio” says Mike Coy, Global Marketing Manager at EDAX. “It offers rapid, non-destructive composition and thickness measurement and analysis on virtually any material.” 

Typical measurement applications include metal coating analysis, Mo, Cd, Te, and Se thickness measurements in all CIGS PV combinations as well as CdS and related buffer layers. It is an excellent choice for R&D, process development and failure analysis, facilitating material selection and recipe formulation in a pre- or early production ramp phase and guaranteeing complete process control from R&D to manufacturing. 

Areas of application for the SMX-BEN include photovoltaic, manufacturing, protective coatings, metallic layer measurements, corrosion/wear and thermal barrier analysis. 

“The addition of the SMX-BEN to the EDAX portfolio of analysis tools gives our customers yet another exciting option, ensuring that we continue to provide the best, optimized solutions for all their materials characterization needs” concludes Mr. Coy. 

EDAX is the acknowledged leader in Energy Dispersive Microanalysis, Electron Backscatter Diffraction and X-ray Fluorescence instrumentation. EDAX designs, manufactures, installs and services high-quality products and systems for leading companies in the semiconductor, metals, geological, pharmaceutical, biomaterials, and ceramics markets. 

Since 1962, EDAX has used its knowledge and experience to develop ultra-sensitive silicon radiation sensors, digital electronics and specialized application software that facilitate solutions to research, development and industrial requirements. 

EDAX is a unit of the Materials Analysis Division of AMETEK, Inc., which is a leading global manufacturer of electronic instruments and electromechanical devices with annual sales of $4.0 billion. 

For further information about EDAX, contact: 

Sue Arnell 
EDAX, Inc. 
91 McKee Drive, Mahwah, NJ 07430 
Tel: (201) 529-4880 • Fax: (201) 529-3156 
E-mail:  [email protected] 
Website:  www.edax.com 

Click here for a hi-res image of the EDAX XLNCE SMX-BEN XRF Analyzer

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